Measurement of connectivity in nanowire network

The aim of this project was to design an interface between Keithley Source Measure Unit (SMU) and Labview for two probe and four probe measurements of nano wire networks using probe station. Also, an interface to perform voltage and frequency sweep for small voltage signal using LCR meter was designed.
During the second part of the project, statistical analysis of length and width of nanowire network for different samples was undertaken. Using 'ImageJ' software, measurements on images of nanowire network, obtained from Scanning electron microscope (SEM), was performed. It was later used to compare it with its electrical properties.

Manual

Standard operating procedure.pdf
Standard operating procedure.pdf

SEM imaging of nanowire network

SEM imaging for length measurement
SEM imaging for length measurement
SEM imaging for width measurement
SEM imaging for width measurement

Author

Anurag Gupta is an M.S. graduate in Electrical and Computer Engineering from Cornell University. He also holds an M.Tech degree in Systems and Control Engineering and a B.Tech degree in Electrical Engineering from the Indian Institute of Technology, Bombay.